Analysis of localized high-frequency substrate noise
نویسندگان
چکیده
In mixed-signal designs, substrate coupling of digital circuit noise can severely compromise the behavior of sensitive analog circuits. Proper characterization of substrate noise is therefore indispensable. In this paper, we present an experimental setup for the characterization of directly coupled substrate noise in bulk-type CMOS. We have integrated configurable substrate noise generation and measurement circuits on a 0.18μm CMOS test chip. The noise measurements have been compared to simulations using a substrate model extracted with Cadence’s Substrate Noise Analyst software, and a good match was found.
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